| Sebaka sa Wavelength | : | 190-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 4nm, 1nm, 0,5nm boikhethelo) |
| Ho Nepaha ha Wavelength | : | ±0.3nm |
| Wavelength Reproducibility | : | ≤0.15nm |
| Sistimi ea Photometric | : | Beam e habeli, scan ninete, li-detectors tse peli |
| Ho nepahala ha Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | ≤0.15%τ |
| Mokhoa oa ho sebetsa | : | T, A, C, E |
| Range ea Photometric | : | -0.3-3.5A |
| Leseli Le khelohileng | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Botsitso | : | ≤0.001A/h (ho 500nm, ka mor'a ho futhumala) |
| Lerata | : | ± 0.001A (ho 500nm, ka mor'a ho futhumala) |
| Pontšo | : | LCD e boputsoa ba lisenthimithara tse 6 |
| Mofuputsi | : | Silicon photo-diode |
| Matla | : | AC 220V/50Hz, 110V/60Hz 180W |
| Litekanyo | : | 630×470×210mm |
| Boima ba 'mele | : | 26kg |
| Sebaka sa Wavelength | : | 190-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 4nm, 1nm, 0,5nm boikhethelo) |
| Ho Nepaha ha Wavelength | : | ±0.3nm |
| Wavelength Reproducibility | : | 0.15nm |
| Sistimi ea Photometric | : | Ho lekola karo-karolelano ea li-beam, ho hlahloba ka boits'oaro, li-detectors tse peli |
| Ho nepahala ha Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | 0.2% τ |
| Mokhoa oa ho sebetsa | : | T, A, C, E |
| Range ea Photometric | : | -0.3-3A |
| Leseli Le khelohileng | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Botsitso | : | ≤0.001A/30min (ho 500nm, kamora ho futhumala) |
| Lerata | : | ± 0.001A (ho 500nm, ka mor'a ho futhumala) |
| Pontšo | : | LCD e boputsoa ba lisenthimithara tse 6 |
| Mofuputsi | : | Silicon photo-diode |
| Matla | : | AC 220V/50Hz, 110V/60Hz 180W |
| Litekanyo | : | 630×470×210mm |
| Boima ba 'mele | : | 26kg |
| Sebaka sa Wavelength | : | 190-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 1nm, boikhethelo) |
| Ho Nepaha ha Wavelength | : | ±0.3nm |
| Wavelength Reproducibility | : | 0.2nm |
| Sistimi ea Photometric | : | Beam e le 'ngoe, grating ea sefofane ea 1200L / mm |
| Ho nepahala ha Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | ≤0.15%τ |
| Mokhoa oa ho sebetsa | : | T, A(-0.3-3A), C, E |
| Range ea Photometric | : | -0.3-3A |
| Leseli Le khelohileng | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Botsitso | : | ≤0.001A/30min (ho 500nm, kamora ho futhumala) |
| Lerata | : | ± 0.001A (ho 500nm, ka mor'a ho futhumala) |
| Pontšo | : | LCD e boputsoa ba lisenthimithara tse 6 |
| Mofuputsi | : | Silicon photo-diode |
| Matla | : | AC 220V/50Hz, 110V/60Hz 140W |
| Litekanyo | : | 530×410×210mm |
| Boima ba 'mele | : | 18kg |
| Sebaka sa Wavelength | : | 320-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 1nm, boikhethelo) |
| Ho Nepaha ha Wavelength | : | ±0.5nm |
| Wavelength Reproducibility | : | 0.2nm |
| Sistimi ea Photometric | : | Beam e le 'ngoe, grating ea sefofane ea 1200L / mm |
| Ho nepahala ha Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | ≤0.15%τ |
| Mokhoa oa ho sebetsa | : | T, A, C, E |
| Range ea Photometric | : | -0.3-3A |
| Leseli Le khelohileng | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Botsitso | : | ≤0.001A/30min (ho 500nm, kamora ho futhumala) |
| Mohloli oa Leseli | : | Lebone la tungsten halogen |
| Pontšo | : | LCD e boputsoa ba lisenthimithara tse 6 |
| Mofuputsi | : | Silicon photo-diode |
| Matla | : | AC 220V/50Hz, 110V/60Hz 140W |
| Litekanyo | : | 530×410×210mm |
| Boima ba 'mele | : | 18kg |